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quadrant detector

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  • Kelvin probe force microscope — Kelvin probe force microscopy ( KPFM ), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM) that was [http://dns.ntu ccms.ntu.edu.tw/references/APPL PHYS LETT 58 2921 1991.pdf invented] in 1991.… …   Wikipedia

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